Fei Hui is a Postdoctoral Fellow at Technion-Israel Institute of Technology, Dr. Hui got her Ph.D. degrees in Nanoscience at the University of Barcelona and in Chemistry at Soochow University in 2018. During her Ph.D., she was a visiting student at the Massachusetts Institute of Technology (MIT, USA) for 12 months and the University of Cambridge (UK) for 6 months. Dr. Hui has published over 47 research papers, including Nature Electronics, Advanced Materials, Advanced Functional Materials, ACS Applied Materials and Interfaces, among others. Moreover, she edited one book chapter on CAFM for Wiley-VCH and registered two international patents (one of them granted with 1 Million USD). Dr. Hui has received the 2019 Park AFM Scholarship, the Mobility Grant of the Royal Society of Chemistry, etc. She serves in the editorial board of several journals, like Nanotechnology, Sensors, Frontiers in Electronics, etc. She is also an active member of the technical and publicity committees of renowned international conferences in the field of electronic materials and devices, including IEEE-EDTM, IEEE-IPRS, IEEE-IIRW, and IEEE-IPFA. Her research interests are the development of scanning probe microscopy (SPM) techniques and its based mechanical and electrical characterizations of two-dimensional (2D) materials at the nanoscale.