Very nice paper and prototype, congratulations for the excellent work ! As a constructive observation, the endurance plot could be improved by presenting one data point per cycle instead of one data point per decade (see also M. Lanza et al. ACS Nano 2021, 15, 11, 17214–17231, also available here: https://pubs.acs.org/doi/10.1021/acsnano.1c06980).
Congratulations, outstanding work in the field of 2D materials !
Wonderful work, congratulations !
That is a very attractive work because it goes towards wafer scale integration and shows variability information. Congratulations to the authors !
Excellent work, congratulations to the entire team !
This is a fantastic work because it really addresses the problem of 2D solid-state microelectronic devices and circuits, which is integration and device-to-device variability. Congratulations to all the authors.
Congratulations Chetan ! Very beautiful stuff, I feel very happy for you. Well deserved !
Wonderful contribution and flatchat :-)