Quantifying uncertainty and performing sensitivity analysis in real-world, large-scale numerical simulations is virtually impossible with standard methods. We show that our recently developed sensitivity-driven sparse grid interpolation methods enables these two important tasks at scale.

Peering into the mechanics of nanosheet device structures using x-ray diffraction uniquely reveals the interplay of distinct deformation modes as dictated by their geometry.

We report a dual-band backhaul prototype operating above 100 GHz. It can be dynamically re-configured in real time to avoid interference to passive satellite sensing systems, enabling safe coexistence of active and passive users in this spectrum.